SIMS: Basic Principles and Components

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Avaliações

4.8 (51 classificações)
  • 5 stars
    80%
  • 4 stars
    18%
  • 3 stars
    2%
AS

May 19, 2020

It was very informative and I am happy to competed this wonderful course. Very point to point effort done by Coursera and MEPhI.

HD

May 26, 2020

This course covers a lot of important topics really well. The analysis part is explained in a great way.

Na lição
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Ministrado por

  • Sadovsky Yaroslav

    Sadovsky Yaroslav

    Assistant

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